Stigmatic broadband spectroscopic instruments below 300 angstrom
SOFT X-RAY LASERS AND APPLICATIONS II
Ragozin, EN; Andreev, SS; Bijkerk, F; Kolachevsky, NN; Louis, E; Pirozhkov, AS; Salashchenko
1997г. т. 3156 номер стр.. 331-342 (цит. wos) 2 тип: труды

DOI - 10.1117/12.279414
WoS id - WOS:000071157000038

Spectroscopic characterization of plane multilayer diffraction gratings using a laser-plasma soft X-ray radiation source
X-RAY LASERS 1996
Troussel, P; Bac, S; Kolachevsky, NN; Mitropolsky, MM; Ragozin, EN
1996г. т. номер 151 стр.. 358-360 (цит. wos) 1 тип: книга в серии

Scopus id - 2-s2.0-84954041360
WoS id - WOS:A1996BH42G00079

Spectral characteristics of plane multilayer amplitude diffraction gratings for the soft X-ray range.
KVANTOVAYA ELEKTRONIKA
Troussel, P; Bac, S; Kolachevskii, NN; Mitropolskii, MM; Ragozin, EN
1996г. т. 23 номер 10 стр.. 923-926 (цит. wos) 1 тип: публикация в журнале

Scopus id - 2-s2.0-84954041360
WoS id - WOS:A1996VU45200015

Stigmatic high-resolution high-throughput XUV spectroscopic instruments employing unconventional optical components
SOFT X-RAY LASERS AND APPLICATIONS
Ragozin, EN; Kolachevsky, NN; Mitropolsky, MM; Pokrovsky, YY; Fedorenko, AI; Kondratenko, VV; Yulin
1995г. т. 2520 номер стр.. 297-308 (цит. wos) 5 тип: труды

DOI - 10.1117/12.221645
WoS id - WOS:A1995BE29B00034

Laser-plasma source of polarized monochromatic beams in the XUV around multilayer mirrors
SOFT X-RAY LASERS AND APPLICATIONS
Ragozin, EN; Kolachevsky, NN; Mitropolsky, MM; Pokrovsky, YY; Shevelko, AP; Vasilev, AA; Platonov, YY все авторы
1995г. т. 2520 номер стр.. 309-317 (цит. wos) 3 тип: труды

DOI - 10.1117/12.221646
WoS id - WOS:A1995BE29B00035

CHARACTERIZATION OF IMAGING NORMAL-INCIDENCE MULTILAYER MIRRORS FOR THE 40-300-ANGSTROM RANGE BY SPECTROSCOPIC TECHNIQUES USING A LASER-PLASMA RADIATION SOURCE
ULTRASHORT WAVELENGTH LASERS II
RAGOZIN, EN; KOLACHEVSKY, NN; MITROPOLSKY, MM; SLEMZIN, VA; SALASHCHENKO, NN
1994г. т. 2012 номер стр.. 209-218 тип: труды

DOI - 10.1117/12.167387
WoS id - WOS:A1994BZ74X00023

STIGMATIC HIGH-RESOLUTION HIGH-THROUGHPUT NARROW-BAND DIFFRACTION SPECTROGRAPH EMPLOYING MULTILAYER MIRRORS
ULTRASHORT WAVELENGTH LASERS II
RAGOZIN, EN; KOLACHEVSKY, NN; MITROPOLSKY, MM; FEDORENKO, AI; KONDRATENKO, VV; YULIN, SA
1994г. т. 2012 номер стр.. 219-231 тип: труды

DOI - 10.1117/12.167388
WoS id - WOS:A1994BZ74X00024

Evaluation of imaging properties of soft-X-ray multilayer mirrors and their application to highly dispersive spectral imaging
X-RAY LASERS 1994 - FOURTH INTERNATIONAL COLLOQUIUM
KOLACHEVSKY, NN; MITROPOLSKY, MM; RAGOZIN, EN; SALASHCHENKO, NN; SLEMZIN, VA; ZHITNIK, IA
1994г. т. номер 332 стр.. 533-537 (цит. wos) 1 тип: труды

Scopus id - 2-s2.0-84954041360
WoS id - WOS:A1994BD37L00090

FABRICATION AND INVESTIGATION OF IMAGING NORMAL-INCIDENCE MULTILAYER MIRRORS WITH A NARROW-BAND REFLECTION IN THE RANGE LAMBDA SIMILAR-OR-EQUAL-TO 4.5 NM
PHYSICA SCRIPTA
AKHSAKHALYAN, AD; KOLACHEVSKY, NN; MITROPOLSKY, MM; RAGOZIN, EN; SALASHCHENKO, NN; SLEMZIN, VA
1993г. т. 48 номер 5 стр.. 516-520 (цит. wos) 12 тип: публикация в журнале

DOI - 10.1088/0031-8949/48/5/002
WoS id - WOS:A1993MJ52100002

STIGMATIC HIGH-RESOLUTION HIGH-THROUGHPUT NARROW-BAND DIFFRACTION SPECTROGRAPH EMPLOYING X-RAY MULTILAYER MIRRORS
PHYSICA SCRIPTA
RAGOZIN, EN; KOLACHEVSKY, NN; MITROPOLSKY, MM; FEDORENKO, AI; KONDRATENKO, VV; YULIN, SA
1993г. т. 47 номер 4 стр.. 495-500 (цит. wos) 8 тип: публикация в журнале

DOI - 10.1088/0031-8949/47/4/004
WoS id - WOS:A1993KZ21300004